• DocumentCode
    2492865
  • Title

    A holistic approach to product marketability measurements-the PMM approach

  • Author

    Murthy, K.R.S. ; Kadur, Anantha ; Rao, Padma

  • Author_Institution
    AT&T Bell Labs., Murray Hill, NJ, USA
  • fYear
    1994
  • fDate
    17-19 Oct 1994
  • Firstpage
    323
  • Lastpage
    329
  • Abstract
    This paper approaches product marketability from a holistic point of view. The paper presents a systematic and quantitative procedure for the estimation of marketability of high technology products. Guidelines to set up a holistic suite of metrics called product marketability metrics (PMM) are presented. Guidelines are also given to estimate the PMM suite of metrics in different stages of the evolution of the product/service including concept, design, feasibility verification, detailed design and testing, pilot marketing and full scale marketing campaign. The metrics are very helpful for quantitative comparison of multiple schemes of product design, feature packaging and marketing for a given product or product line. The PMM identification and measurement process helps the R&D, manufacturing, marketing and corporate managers to not only make a GO/NO GO decision on a product, but also lets them routinely verify/monitor the PMM goals and steer their respective organizations to meet the target PMM goal
  • Keywords
    marketing; packaging; product development; research and development management; GO/NO GO decision; R&D; corporate managers; feature packaging; full scale marketing campaign; guidelines; high technology products; holistic approach; manufacturing; pilot marketing; product design; product marketability measurements; product marketability metrics; testing; Companies; Force measurement; Guidelines; Optimized production technology; Packaging; Product design; Research and development; Technological innovation; Testing; Timing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering Management Conference, 1994. 'Management in Transition: Engineering a Changing World', Proceedings of the 1994 IEEE International
  • Conference_Location
    Dayton North, OH
  • Print_ISBN
    0-7803-1955-9
  • Type

    conf

  • DOI
    10.1109/IEMC.1994.379914
  • Filename
    379914