DocumentCode :
2493851
Title :
Hydrogen sensitivity of GaAs HEMT amplifiers: the effect of bias mode
Author :
Eng, David C. ; Scarpulla, John
Author_Institution :
TRW Inc., Redondo Beach, CA, USA
fYear :
1999
fDate :
1999
Firstpage :
89
Lastpage :
93
Abstract :
The effect of hydrogen incorporation is well known to degrade the performance of GaAs HEMT transistors. The main source of hydrogen is in the plated internal metal surfaces of a hermetic enclosure used to package GaAs MMICs. We have found a new circuit technique for hydrogen mitigation, which may be useful under certain circumstances - use of a current regulation scheme for each transistor in a MMIC. The value of this method is that even under extremely high levels of hydrogen and accelerated temperature conditions where the HEMTs are expected to fully saturate with hydrogen, the net effect on RF gain degradation can be minimized to a tolerably low level
Keywords :
HEMT circuits; III-V semiconductors; MMIC amplifiers; field effect MMIC; gallium arsenide; hydrogen; GaAs HEMT; GaAs:H; MMIC amplifier; RF gain; bias mode; circuit technique; hydrogen sensitivity; Acceleration; Circuits; Current control; Degradation; Gallium arsenide; HEMTs; Hydrogen; MMICs; Packaging; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
GaAs Reliability Workshop, 1999. Proceedings
Conference_Location :
Monterey, CA
Print_ISBN :
0-7908-0100-0
Type :
conf
DOI :
10.1109/GAASRW.1999.874167
Filename :
874167
Link To Document :
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