• DocumentCode
    2494470
  • Title

    Developing an underfill process for dense flip chip applications

  • Author

    Leong, William H.

  • Author_Institution
    Electron. Assembly Dev. Center, Hewlett-Packard Co., Palo Alto, CA, USA
  • fYear
    1996
  • fDate
    14-16 Oct 1996
  • Firstpage
    10
  • Lastpage
    17
  • Abstract
    HP´s current generation workstation processor uses flip chip on ceramic technology to help achieve increased clock speeds and higher I/O count. Due to the large die size, underfill is needed to improve the fatigue life of the flip chip solder connections. The processor package offers limited access for dispensing the underfill, and places limits on excess flow on top of and around the die. An underfill process was developed for the processor that consists of depositing the underfill material in multiple passes. A series of experiments were performed to characterize the material properties, flow, and dispense equipment, and to optimize the cycle time. This paper presents the different experiments and a methodology for combining the results to specify a process. The results of this work can be applied to develop an underfill process for similar applications involving large flip chip die with limited dispensing access
  • Keywords
    fatigue; flip-chip devices; integrated circuit interconnections; integrated circuit packaging; reflow soldering; cycle time; dense flip chip applications; dispensing access; excess flow; fatigue life; multiple passes; solder connections; underfill process; Ceramics; Clocks; Curing; Fatigue; Flip chip; Material properties; Packaging; Temperature; Thermal expansion; Thermal stresses;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-3642-9
  • Type

    conf

  • DOI
    10.1109/IEMT.1996.559676
  • Filename
    559676