DocumentCode :
249590
Title :
Detecting new classes via infinite warped mixture models for hyperspectral image analysis
Author :
Hao Wu ; Prasad, Santasriya ; Priya, Tanu
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Houston, Houston, TX, USA
fYear :
2014
fDate :
27-30 Oct. 2014
Firstpage :
5027
Lastpage :
5031
Abstract :
Novelty (new class) detection can be described as the identification of new or “unknown” data that a machine learning system was not aware of during training. The ability to detect new classes can have a significant positive impact on image analysis systems, where the test data (or unlabeled data) may contain information about objects that were not known during training process. Since infinite Gaussian mixture models (IGMM) are capable to fit data with an unknown number of mixtures, the inference scheme based on semi-supervised Gibbs sampling can differentiate between known and novel data by learning the unique data clustering in training and testing modes. In order to deal with non-Gaussian (especially heavy tailed) data, the proposed approach is based on infinite warped mixture models (IWMM). IWMM models assume that each observation has coordinates in a latent space where the data is Gaussian distributed - an IGMM is then learned in that latent space instead. We show that the IWMM model outperforms an IGMM based approach to novelty detection for hyperspectral image analysis.
Keywords :
Gaussian distribution; inference mechanisms; learning (artificial intelligence); object detection; pattern clustering; sampling methods; Gaussian distribution; IWMM model; class detection; data clustering; hyperspectral image analysis; inference scheme; infinite Gaussian mixture model; infinite warped mixture model; latent space learning; machine learning system; semisupervised Gibbs sampling; Adaptation models; Computational modeling; Data models; Hyperspectral imaging; Image analysis; Training; Gibbs Sampling; IGMM; IWMM;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2014 IEEE International Conference on
Conference_Location :
Paris
Type :
conf
DOI :
10.1109/ICIP.2014.7026018
Filename :
7026018
Link To Document :
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