Title :
Spatially different, real-time temporal filtering and dose reduction for dynamic image guidance during neurovascular interventions
Author :
Vasan, S. N Swetadri ; Sharma, P. ; Ionita, C.N. ; Titus, A.H. ; Cartwright, A.N. ; Bednarek, D.R. ; Rudin, S.
Author_Institution :
Electr. Eng. Dept., State Univ. of New York, Buffalo, NY, USA
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
Fluoroscopic systems have excellent temporal resolution, but are relatively noisy. In this paper we present a recursive temporal filter with different weights (lag) for different user selected regions of interest (ROI) to assist the neurointerventionalist during an image guided catheter procedure. The filter has been implemented on a Graphics Processor (GPU), enabling its usage for fast frame rates such as during fluoroscopy. We first demonstrate the use of this GPU-implemented rapid temporal filtering technique during an endovascular image guided intervention with normal fluoroscopy. Next we demonstrate its use in combination with ROI fluoroscopy where the exposure is substantially reduced in the peripheral region outside the ROI, which is then software-matched in brightness and filtered using the differential temporal filter. This enables patient dose savings along with improved image quality.
Keywords :
catheters; diagnostic radiography; filtering theory; medical image processing; ROI fluoroscopy; dose reduction; dynamic image guidance; endovascular image guided intervention; fluoroscopic systems; fluoroscopy; image guided catheter; neurovascular interventions; recursive temporal filter; Aneurysm; Brightness; Filtering theory; Graphics processing unit; Image resolution; Noise; Algorithms; Aneurysm; Computer Graphics; Computer Simulation; Computer Systems; Equipment Design; Fluoroscopy; Humans; Image Processing, Computer-Assisted; Models, Statistical; Neurosurgery; Software; Stents; Time Factors; User-Computer Interface; X-Rays;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6091529