An off-chip current sensor for IDDQ testing of CMOS ICs

Author

Altaf-Ul-Amin, Md ; Darus, Z.M.

Author_Institution

Dept. of Electr., Electron. & Syst. Eng., Univ. Kebangsaan Malaysia, Malaysia

fYear

1998

fDate

2-4 Dec 1998

Firstpage

318

Lastpage

322

Abstract

This paper presents the design of an off-chip current sensor for IDDQ testing of CMOS ICs. An operational amplifier is used to maintain a virtual ground so that the insertion of the sensor in series with the circuit under test (CUT) does not degrade the operating voltage across the CUT during testing. A voltage controlled switch is used to bypass the transient current peaks. The current (IDDQ) is directly converted to voltage with a conversion factor of 5 mV/μA without any amplification. Computer simulation shows the performance of the sensor to detect different bridging faults in c17 benchmark circuit with a 100 kHz test frequency

Keywords

CMOS digital integrated circuits; electric current measurement; electric sensing devices; integrated circuit testing; test equipment; 100 kHz; CMOS ICs; IDDQ testing; bridging faults; offchip current sensor; operational amplifier; transient current peaks bypassing; virtual ground; voltage controlled switch; Benchmark testing; Circuit faults; Circuit testing; Computer simulation; Degradation; Electrical fault detection; Fault detection; Operational amplifiers; Switches; Voltage control;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian

ISSN

1081-7735

Print_ISBN

0-8186-8277-9

Type

conf

DOI

10.1109/ATS.1998.741632

Filename

741632