Dynamic test set generation for analog circuits and systems

Author

Huynh, Sam ; Kim, Seongwon ; Soma, Mani ; Zhang, Jinyan

Author_Institution

Dept. of Electr. Eng., Washington Univ., Seattle, WA, USA

fYear

1998

fDate

2-4 Dec 1998

Firstpage

360

Lastpage

365

Abstract

In this paper, we present an approach to construct a set of dynamic test signals for analog circuits and systems. Testability transfer factors are introduced and we use them as the basis to construct an efficient test set. Fault detectability and fault coverage are defined. Two circuits from the suite of analog and mixed-signal circuits are used to evaluate our approach. The fault coverage is 100% for both circuits studied. The approach presented may be used to construct inputs signals for the selection of an external stimulus applied through an arbitrary waveform generator

Keywords

analogue integrated circuits; automatic test pattern generation; controllability; integrated circuit testing; observability; ATPG; analog circuits; analog systems; dynamic test set generation; fault coverage; fault detectability; signature analysis; testability transfer factors; Analog circuits; Circuit faults; Circuit simulation; Circuit testing; Controllability; Electrical fault detection; Equations; Fault detection; Frequency; H infinity control; Impedance; Intrusion detection; MOSFETs; Observability; Resistors; System testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian

ISSN

1081-7735

Print_ISBN

0-8186-8277-9

Type

conf

DOI

10.1109/ATS.1998.741639

Filename

741639