Title :
Machine vision system for surface defect inspection of printed silicon solar cells
Author :
Yen, Hsu-Nan ; Sie, Yuan-Jhen
Author_Institution :
Dept. of Electron. Eng., St. John´´s Univ., New Taipei, Taiwan
Abstract :
Solar power has become more and more important due to the decrease of the energy sources. The solar cell is the main device to transform solar power to electric power. Since the power efficiency of solar cell is decreased with defects generated in manufacturing process, defect inspection is crucial to ensure the reliability of solar cells. This paper presents a cost-effective machine vision system for surface defect inspection of printed polycrystalline silicon solar cells. The defects of printed busbars and fingers are effectively inspected by using auto-thresholding and projection techniques sequentially in the inspection process. Experimental results have demonstrated that the defect inspection of printed polycrystalline silicon solar cells is very effective with the proposed system.
Keywords :
automatic optical inspection; busbars; computer vision; elemental semiconductors; flaw detection; reliability; silicon; solar cells; autothresholding technique; energy sources; machine vision system; manufacturing process; power efficiency; printed busbars; printed polycrystalline silicon solar cells; projection technique; solar cell reliability; solar power; surface defect inspection; Fingers; Inspection; Machine vision; Photovoltaic cells; Printed circuits; Silicon; Surface treatment; Machine vision; Printed polycrystalline solar cell; Surface defect;
Conference_Titel :
Consumer Electronics (GCCE), 2012 IEEE 1st Global Conference on
Conference_Location :
Tokyo
Print_ISBN :
978-1-4673-1500-5
DOI :
10.1109/GCCE.2012.6379645