• DocumentCode
    2497652
  • Title

    Thermomechanical behavior of ceramic ball grid array based on experiments and FEM simulations

  • Author

    Deletage, J.-Y. ; Fenech, A. ; Bechou, L. ; Ousten, Y. ; Danto, Y. ; Salagoity, M. ; Faure, C. ; Rao, S.

  • Author_Institution
    Bordeaux I Univ., Talence, France
  • fYear
    1996
  • fDate
    14-16 Oct 1996
  • Firstpage
    91
  • Lastpage
    98
  • Abstract
    In this paper, we have performed 2D finite element simulations on CBGA components assembled on FR4 card in order to evaluate the highest stressed regions of the solder joint. The maximum cumulative strain energy has been calculated as a function of the thermal cycling characteristics and of the package size to evaluate the fatigue of the solder joints. Accelerated ageing tests (0°C to 100°C) have been performed on CBGA samples to validate such a global approach. The analysis of the degradation have been performed using direct observation with SEM and also a specific procedure of acoustic imaging allowing the detection of defects located on the inner balls. From the previous FEM simulation results and the experimental data under thermal cycling, we propose a global interpretation, based on general mechanical laws, of the thermomechanical behavior of the CBGA solder joints under thermal cycling. Conclusions about the evolution of the CBGA assemblies criticity with both package size and ball number increase are deduced from this study
  • Keywords
    acoustic imaging; ageing; failure analysis; fatigue; finite element analysis; integrated circuit packaging; integrated circuit reliability; life testing; scanning electron microscopy; soldering; thermal analysis; thermal stresses; 0 to 100 C; 2D finite element simulations; FEM simulations; FR4 card; SEM; accelerated ageing tests; acoustic imaging; ball grid array; ceramic BGA; defects detection; degradation; fatigue; maximum cumulative strain energy; package size; solder joint; stressed regions; thermal cycling characteristics; thermomechanical behavior; Accelerated aging; Assembly; Capacitive sensors; Ceramics; Electronics packaging; Fatigue; Finite element methods; Performance evaluation; Soldering; Thermomechanical processes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Manufacturing Technology Symposium, 1996., Nineteenth IEEE/CPMT
  • Conference_Location
    Austin, TX
  • ISSN
    1089-8190
  • Print_ISBN
    0-7803-3642-9
  • Type

    conf

  • DOI
    10.1109/IEMT.1996.559692
  • Filename
    559692