DocumentCode :
2497867
Title :
Analysis of a multistage interconnection network using binary decision diagrams (BDD)
Author :
Chiu, Jian ; Dugan, Joanne Bechta
Author_Institution :
Nat. Semicond. Corp., Arlington, TX, USA
fYear :
1996
fDate :
23-25 Oct 1996
Firstpage :
34
Lastpage :
43
Abstract :
The authors use the BDD to help derive a closed-form solution for the reliability of a multistage interconnection network with n stages. The BDD reveals repeated structures, the reliability of which can be encoded in a recursive formula. An exact solution of a network with an arbitrary number of stages can be computed in time proportional to the number of stages. They also provide results which include the concept of imperfect coverage, in which two mutually-exclusive failure modes (with different effects) are possible for certain switching elements
Keywords :
Boolean functions; computational complexity; diagrams; fault tolerant computing; multistage interconnection networks; reliability; binary decision diagrams; closed-form solution; computation time; exact solution; imperfect coverage; multistage interconnection network analysis; mutually-exclusive failure modes; recursive formula; reliability; repeated structures; switching elements; Binary decision diagrams; Boolean functions; Closed-form solution; Communication switching; Data structures; Fault tolerance; Multiprocessor interconnection networks; Postal services; Semiconductor device reliability; Switches;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliable Distributed Systems, 1996. Proceedings., 15th Symposium on
Conference_Location :
Nigara-on-the-Lake, Ont.
ISSN :
1060-9857
Print_ISBN :
0-8186-7481-4
Type :
conf
DOI :
10.1109/RELDIS.1996.559693
Filename :
559693
Link To Document :
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