Title :
Testing Embedded Memories: Is BIST The Ultimate Solution? Answers to the Key Issues
Author :
van de Goor, A.J.
Keywords :
Application specific integrated circuits; Built-in self-test; Fault detection; Hardware; Logic testing; System testing; Temperature dependence;
Conference_Titel :
Test Symposium, 1998. ATS '98. Proceedings. Seventh Asian
Conference_Location :
Singapore
Print_ISBN :
0-8186-8277-9
DOI :
10.1109/ATS.1998.741671
