DocumentCode :
2498044
Title :
DC characteristics of In0.52Al0.48As/ In0.53(AlxGa1-x)0.47As NPN double heterojunction bipolar transistors
Author :
Huang, Chao-Hsing ; Lee, Tsuen-Lin ; Lin, Hao-Hsiung
Author_Institution :
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
fYear :
1993
fDate :
19-22 Apr 1993
Firstpage :
439
Lastpage :
442
Abstract :
Wide band gap materials, InAlAs and InAlGaAs, were used in the collector of double heterojunction bipolar transistors (DHBTs). Base-collector designs and their effects on the DC characteristics of the DHBTs were investigated. It is found that in the InAlAs/InGaAs/InAlAs DHBT, the unusual large conduction band discontinuity results in a two-dimensional electron gas (2DEG) stored in base-collector abrupt junction. This 2DEG will push the heterojunction spike up and cause a reach-through effect with a InGaAs space layer inserted between the base-collector junction. Junction grading seems to be the only method to remove the effect. For the InAlAs/InGaAs/InAlGaAs DHBT, the smaller the conduction band discontinuity, the less significant is the 2DEG effect. When the discontinuity is smaller than 0.27 eV, the knee-shape and reach-through characteristics disappear
Keywords :
III-V semiconductors; aluminium compounds; conduction bands; gallium arsenide; heterojunction bipolar transistors; indium compounds; two-dimensional electron gas; wide band gap semiconductors; 2DEG; DC characteristics; In0.52Al0.48As-In0.53(Alx Ga1-x)0.47As; NPN double heterojunction bipolar transistors; base collector designs; base-collector abrupt junction; knee-shape; reach-through characteristics; semiconductor; two-dimensional electron gas; unusual large conduction band discontinuity; Double heterojunction bipolar transistors; Electric breakdown; Electrons; Gallium arsenide; Heterojunction bipolar transistors; Indium compounds; Indium gallium arsenide; Indium phosphide; Molecular beam epitaxial growth; Optical materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on
Conference_Location :
Paris
Print_ISBN :
0-7803-0993-6
Type :
conf
DOI :
10.1109/ICIPRM.1993.380589
Filename :
380589
Link To Document :
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