Title :
High-Q silicon flexural resonators for vibrating inertial sensors: Investigations of the limiting damping mechanisms
Author :
Le Foulgoc, B. ; Le Traon, O. ; Masson, S. ; Parent, A. ; Bourouina, Tarik ; Marty, Frederic ; Bosseboeuf, A. ; Parrain, F. ; Mathias, Herve ; Grilles, J.-P.
Author_Institution :
ONERA, Chatillon
Abstract :
In designing micro-scale vibrating sensors, the achievement of very high quality factor (Q) resonators working in bending mode remains a major issue. Special attention has been paid in this work to explore the Q limitations of single-crystal silicon bending beam resonators and their dependences on geometry, temperatures and pressure for a large range of resonators. In order to preserve the resonating element from support damping, a system with high decoupling efficiency has been optimized using FEM analyses and implemented. Quality factor as a function of frequency shows the transition between thermoelastic damping (TED) and surface damping as limiting mechanism with the miniaturization of the resonators: At high vacuum, the thermoelastic theory is experimentally validated to be the main damping source for Q up to 4.0x104. Beyond these values (Q > 1.4x105) the surface effects are evidenced and characterized with thickness and frequency variations.
Keywords :
damping; micromechanical devices; resonators; vibration measurement; FEM; high quality factor resonators; limiting damping mechanisms; microscale vibrating sensors; silicon flexural resonators; single-crystal silicon bending beam resonators; surface damping; thermoelastic damping; vibrating inertial sensors; Accelerometers; Damping; Frequency; Geometry; Mechanical sensors; Oscillators; Q factor; Silicon; Thermoelasticity; Vibrations;
Conference_Titel :
Sensors, 2006. 5th IEEE Conference on
Conference_Location :
Daegu
Print_ISBN :
1-4244-0375-8
Electronic_ISBN :
1930-0395
DOI :
10.1109/ICSENS.2007.355884