Title :
A method for calculating low probability impulse breakdown voltages in SF6-filled gaps
Author :
Wenguo Gu ; Zhang, Qiaogen ; Qiu, Yuchang
Author_Institution :
Dept. of Electr. Power, Huazhong Univ. of Sci. & Technol., China
Abstract :
From the analysis of the abnormal discharge in SF6-filled gaps, a method for calculating low probability impulse breakdown voltage is put forward, which consists of three limiting lines: the streamer breakdown line, the low probability impulse breakdown level and the streamer onset line in different gas pressure ranges. The calculated value gives a safety margin compared with the measured value
Keywords :
SF6 insulation; discharges (electric); electric breakdown; SF6; SF6-filled gaps; abnormal discharge; gas pressure; limiting lines; low probability impulse breakdown level; low probability impulse breakdown voltages; streamer breakdown line; streamer onset line; Breakdown voltage; Bridge circuits; Corona; Electric breakdown; Electrodes; Insulation; Lightning; Pressure measurement; Probability; Safety;
Conference_Titel :
Electrical Insulating Materials, 1998. Proceedings of 1998 International Symposium on
Conference_Location :
Toyohashi
Print_ISBN :
4-88686-050-8
DOI :
10.1109/ISEIM.1998.741732