• DocumentCode
    2500494
  • Title

    Planar and selective MOVPE of GaInAs-InP structures with novel group III and group V precursors

  • Author

    Scholz, F. ; Ottenwälder, D. ; Eckel, M. ; Locke, K. ; Frankowsky, G. ; Wacker, T.

  • Author_Institution
    Stuttgart Univ., Germany
  • fYear
    1993
  • fDate
    19-22 Apr 1993
  • Firstpage
    48
  • Lastpage
    51
  • Abstract
    The authors have studied the combination of the two alternative precursors DADI (dimethylaminopropyl-dimethylindium) and tertiary-butyl-arsine (TBA) in atmospheric pressure metalorganic vapor phase epitaxy of GaInAs lattice matched to InP. They could not detect any problem which could be specifically due to this precursor combination. In particular, no parasitic side reactions have been observed either directly or indirectly. The growth of GaInAs at a very low V/III ratio of 2 could be realized with this precursor combination. By studying selectively grown GaInAs stripes which have been grown at low pressure using either DADI or TMIn, a better selectivity was obtained for the DADI grown structures. The growth rate enhancement near the edge of larger fields as well as the composition changes for different ratios of stripe width and masked area could be lowered by this precursor
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; semiconductor growth; semiconductor heterojunctions; vapour phase epitaxial growth; GaInAs-InP; GaInAs-InP structures; atmospheric pressure; dimethylaminopropyl-dimethylindium; group III precursors; group V precursors; growth rate enhancement; metalorganic vapor phase epitaxy; parasitic side reactions; planar MOVPE; selective MOVPE; selectivity; stripe width; tertiary-butyl-arsine; Chemicals; Epitaxial growth; Epitaxial layers; Indium phosphide; Pressure control; Solids; Stability; Substrates; Surface morphology; Temperature dependence;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Indium Phosphide and Related Materials, 1993. Conference Proceedings., Fifth International Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    0-7803-0993-6
  • Type

    conf

  • DOI
    10.1109/ICIPRM.1993.380713
  • Filename
    380713