DocumentCode
2500544
Title
Inverse scattering problem in diagnostics of multilayer periodic structures
Author
Gaikovich, K.P. ; Gaikovich, P.K. ; Sumin, M.I.
Author_Institution
Inst. for Phys. of Microstructures, Nizhny Novgorod, Russia
fYear
2012
fDate
17-21 Sept. 2012
Firstpage
226
Lastpage
228
Abstract
The dual regularization method is applied in the inverse problem of electromagnetic scattering to retrieve permittivity inhomogeneities in multilayer periodic dielectric structures. Based on the developed theory, the solution algorithm has been worked out and applied in the numerical simulation of the multifrequency reflectometry diagnostics of inhomogeneities in multilayer structures of X-ray optics.
Keywords
X-ray optics; electromagnetic wave scattering; permittivity; X-ray optics; dual regularization method; inverse electromagnetic scattering problem; multifrequency reflectometry diagnostics; multilayer periodic structures; numerical simulation; permittivity inhomogeneities; Inverse problems; Nonhomogeneous media; Numerical simulation; Periodic structures; Permittivity; Reflectometry; Scattering; Dual regularization; electromagnetic sounding; inverse scattering problem; multilayered periodic structures; permittivity profile;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrawideband and Ultrashort Impulse Signals (UWBUSIS), 2012 6th International Conference on
Conference_Location
Sevastopol
Print_ISBN
978-1-4673-1940-9
Type
conf
DOI
10.1109/UWBUSIS.2012.6379788
Filename
6379788
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