• DocumentCode
    2500599
  • Title

    Kernel Domain Description with Incomplete Data: Using Instance-Specific Margins to Avoid Imputation

  • Author

    Gripton, Adam ; Lu, Weiping

  • Author_Institution
    Sch. of Math. & Comput. Sci., Heriot-Watt Univ., Edinburgh, UK
  • fYear
    2010
  • fDate
    23-26 Aug. 2010
  • Firstpage
    2921
  • Lastpage
    2924
  • Abstract
    We present a method of performing kernel space domain description of a dataset with incomplete entries without the need for imputation, allowing kernel features of a class of data with missing features to be rigorously described. This addresses the problem that absent data completion is usually required before kernel classifiers, such as support vector domain description (SVDD), can be applied; equally, few existing techniques for incomplete data adequately address the issue of kernel spaces. Our method, which we call instance-specific domain description (ISDD), uses a parametrisation framework to compute minimal kernelised distances between data points with missing features through a series of optimisation runs, allowing evaluation of the kernel distance while avoiding subjective completions of missing data. We compare results of our method against those achieved by SVDD applied to an imputed dataset, using synthetic and experimental datasets where feature absence has a non-trivial structure. We show that our methods can achieve tighter sphere bounds when applied to linear and quadratic kernels.
  • Keywords
    feature extraction; support vector machines; SVDD; instance-specific domain description; instance-specific margins; kernel classifiers; kernel domain description; kernel space domain; linear-quadratic kernels; minimal kernelised distances; support vector domain description; Artificial neural networks; Data models; Equations; Kernel; Optimization; Pattern recognition; Support vector machines; Classification; Feature analysis; Feature extraction; Feature reduction; Kernels; Ranking; Regression; Support vector machines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Pattern Recognition (ICPR), 2010 20th International Conference on
  • Conference_Location
    Istanbul
  • ISSN
    1051-4651
  • Print_ISBN
    978-1-4244-7542-1
  • Type

    conf

  • DOI
    10.1109/ICPR.2010.716
  • Filename
    5597060