Title :
Theoretical normalized site attenuation calculations by spreadsheet analysis
Author_Institution :
Compaq Comput. Corp., Cupertino, CA, USA
Abstract :
This paper describes an analysis methodology that implements the theoretical normalized site attenuation (NSA) model into a standard electronic spreadsheet program, such as Microsoft Excel, that can calculate and plot the exact theoretical NSA value for any given frequency of interest. The theoretical NSA is referenced in ANSIC63.4(1992) and is discussed in numerous papers in the open literature. The mathematical model for the theoretical NSA consists of a set of complex equations for horizontal and vertical polarization and is best suited for calculation via computer automation. The spreadsheet analysis technique addressed in this paper has several advantages: (1) the popularity of spreadsheets today provides an easy to use software platform that can be utilized to fully automate the complex theoretical NSA calculations,( 2) the spreadsheet provides an open framework whereby all areas of the model are open for visual inspection, and (3) the spreadsheet model can be used for “what-if” scenarios whereby the test site input parameters are easily modified and the calculations re-pun for new test site configurations
Keywords :
ANSI standards; electrical engineering computing; electromagnetic compatibility; electromagnetic interference; electromagnetic wave absorption; electromagnetic wave polarisation; measurement standards; spreadsheet programs; ANSIC63.4; EMC; EMI; Microsoft Excel; NSA; complex equations; computer automation; electronic spreadsheet program; horizontal polarization; mathematical model; normalized site attenuation calculations; radiation emission measurement; software platform; spreadsheet analysis; test site configurations; test site input parameters; vertical polarization; visual inspection; Attenuation; Automatic testing; Automation; Equations; Frequency; Inspection; Mathematical model; Polarization; Software testing; Spreadsheet programs;
Conference_Titel :
Electromagnetic Compatibility, 2000. IEEE International Symposium on
Conference_Location :
Washington, DC
Print_ISBN :
0-7803-5677-2
DOI :
10.1109/ISEMC.2000.874747