DocumentCode :
2502696
Title :
Smart selection of indirect parameters for DC-based alternate RF IC testing
Author :
Ayari, Haithem ; Azais, Florence ; Bernard, Serge ; Comte, Mariane ; Renovell, Michel ; Kerzerho, Vincent ; Potin, Olivier ; Kelma, Christophe
Author_Institution :
LIRMM, Univ. Montpellier 2, Montpellier, France
fYear :
2012
fDate :
23-25 April 2012
Firstpage :
19
Lastpage :
24
Abstract :
In this paper, we investigate an alternate test strategy for RF integrated circuits based on DC measurements. A methodology to select the appropriate DC parameters is presented, that allows precise estimation of the DUT performances while minimizing the number of measurements to be carried out. The method is demonstrated both on simulation test data from a Low-Noise Amplifier (LNA) and production test data from a Power Amplifier (PA). Results indicate that good prediction of the RF performances can be achieved using only a reduced number of DC measurements.
Keywords :
integrated circuit testing; low noise amplifiers; power amplifiers; radiofrequency integrated circuits; DC measurement; DC-based alternate RFIC testing; DUT performance; LNA; low-noise amplifier; power amplifier; production test data; simulation test data; smart selection; Accuracy; Context; Performance evaluation; Production; Radio frequency; Semiconductor device measurement; Testing; DC measurements; RF integrated circuits; Test; alternate test; test compaction;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium (VTS), 2012 IEEE 30th
Conference_Location :
Hyatt Maui, HI
ISSN :
1093-0167
Print_ISBN :
978-1-4673-1073-4
Type :
conf
DOI :
10.1109/VTS.2012.6231074
Filename :
6231074
Link To Document :
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