Title :
Performance evaluation of the first commercial PUF-embedded RFID
Author :
Kang, Hyunho ; Hori, Yohei ; Satoh, Akashi
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba, Japan
Abstract :
Physical unclonable functions (PUFs) generate device-unique data streams by using manufacturing variations of each LSI. High-security authentication for counterfeiting prevention and secret key generation for data encryption are provided through PUFs. Such technology is a recent innovation, and Verayo Inc. created the world´s first commercially available PUF only a few years ago. Toppan Printing Co., Ltd., has since integrated Verayo´s PUF ICs into radio frequency identification (RFID) tags in order to develop a new security business in the near field communication market. In collaboration with Toppan, we have conducted acceleration tests on their PUF-embedded RFID tag to evaluate its performance and reliability.
Keywords :
cryptography; integrated circuits; near-field communication; radiofrequency identification; LSI; PUF-embedded RFID tag; Toppan Printing Co Ltd; Verayo Inc; Verayo PUF IC; acceleration tests; counterfeiting prevention; data encryption; device-unique data stream generation; high-security authentication; near field communication market; performance evaluation; physical unclonable functions; radio frequency identification tag; secret key generation; Counterfeiting; Cryptography; Integrated circuits; RFID tags; Reliability;
Conference_Titel :
Consumer Electronics (GCCE), 2012 IEEE 1st Global Conference on
Conference_Location :
Tokyo
Print_ISBN :
978-1-4673-1500-5
DOI :
10.1109/GCCE.2012.6379926
