Author :
Metra, Cecilia ; Thibeault, Claude
Author_Institution :
University of Bologna, Italy
Abstract :
Welcome to VTS 2012, the thirtieth in a series of annual symposia that focus on innovation in the field of testing of integrated circuits and systems.
Conference_Titel :
VLSI Test Symposium (VTS), 2012 IEEE 30th
Conference_Location :
Maui, HI, USA
Print_ISBN :
978-1-4673-1073-4
DOI :
10.1109/VTS.2012.6231110
