Author :
Karri, Ramesh ; Song, Peilin ; Sinanoglu, Ozgur
Author_Institution :
NYU-Poly, New York, NY, USA
Abstract :
This tutorial is most suitable for DFT and Test Engineers, Validation and Verification engineers, Researchers and students in DFT, testing and validation, hardware security.
Keywords :
VLSI; design for testability; integrated circuit testing; security; DFT; VLSI security; VLSI test; hardware security; test engineers; validation engineers; verification engineers;
Conference_Titel :
VLSI Test Symposium (VTS), 2012 IEEE 30th
Conference_Location :
Hyatt Maui, HI
Print_ISBN :
978-1-4673-1073-4
DOI :
10.1109/VTS.2012.6231117
