Title :
High quality amorphous silicon films prepared by atmospheric-pressure photo-CVD
Author :
Kim, Woo Yeol ; Konagai, Makoto ; Takahashi, Kiyoshi
Author_Institution :
Dept. of Electr. & Electron. Eng., Tokyo Inst. of Technol., Japan
Abstract :
The authors prepared undoped a-Si:H films by an atmospheric-pressure mercury-sensitized photo-CVD (chemical vapor deposition) process. This technique made it possible to reduce the impurity concentration and to obtain high-quality films. The maximum deposition rate of 45 A/min was obtained by optimizing the mercury reservoir temperature and the flow rate of SiH4. The maximum ratio of photoconductivity (AM-1, 100 mW/cm2) to dark conductivity was 6*106 with an optical bandgap of 1.78 eV. The concentration of oxygen in the films prepared by this growth technique was 2*1018 cm-3, which is one order of magnitude lower than that of films grown by low-pressure photo-CVD. At an initial stage, an efficiency of 9.1% has been obtained for a solar cell with the i layer deposited by atmospheric-pressure photo-CVD.
Keywords :
amorphous semiconductors; chemical vapour deposition; elemental semiconductors; hydrogen; semiconductor thin films; silicon; solar cells; amorphous Si:H solar cells; atmospheric-pressure photo-CVD; dark conductivity; optical bandgap; photoconductivity; semiconductors; Amorphous silicon; Chemical vapor deposition; Conductivity; Impurities; Optical films; Photoconductivity; Photonic band gap; Reservoirs; Semiconductor films; Temperature;
Conference_Titel :
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location :
Las Vegas, NV, USA
DOI :
10.1109/PVSC.1988.105703