Title :
The effects of tip magnetization on magnetic force microscopy images
Author :
Rice, P. ; Russek, S.E.
Author_Institution :
Natl. Inst. of Standards and Technol.
Keywords :
Coatings; Electromagnetic forces; Magnetic field measurement; Magnetic force microscopy; Magnetic forces; Magnetic moments; NIST; Paper technology; Saturation magnetization; Spatial resolution;
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
DOI :
10.1109/INTMAG.1998.742097