DocumentCode :
2506081
Title :
A CAD tool for Stochastic Macromodel generation and analog IP characterization for system level application
Author :
Banerjee, Amitava ; Khawas, Arnab
Author_Institution :
Nat. Semicond., India Designs Pvt Ltd., Bangalore, India
fYear :
2010
fDate :
17-19 Dec. 2010
Firstpage :
1
Lastpage :
4
Abstract :
Process variations have increased significantly with scaling technologies. This has led to deviations in analog circuit performance from their expected values. Macromodeling of analog circuits is emerging to be an essential paradigm of CAD, leading to significant benefits for simulation, design space exploration, inter process migration, test development etc. In this work, we develop a CAD tool for automatic generation of macromodels from available specifications and extend the methodology to model the effect of process variation induced soft parametric faults. Simulation results illustrate that the methodology is suitable for accurate macromodeling with objective of rapid simulation. In addition, the performance of circuits under process variation can be effectively statistically modeled for the estimation of system level yield.
Keywords :
Monte Carlo methods; analogue circuits; circuit CAD; circuit simulation; fault simulation; industrial property; stochastic processes; CAD tool; Monte Carlo simulation; analog IP characterization; analog circuit macromodelling; circuit simulation; circuits under process variation; design space exploration; interprocess migration; soft parametric faults; stochastic macromodel generation; system level application; Circuit faults; Equations; Integrated circuit modeling; Mathematical model; Solid modeling; Stochastic processes; Transistors; Macromodel; Monte Carlo; Operational Transconductance Amplifier; Stochastic Macromodel;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
India Conference (INDICON), 2010 Annual IEEE
Conference_Location :
Kolkata
Print_ISBN :
978-1-4244-9072-1
Type :
conf
DOI :
10.1109/INDCON.2010.5712600
Filename :
5712600
Link To Document :
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