Title :
Efficient statistical analysis and diagnosis of high speed source synchronous interfaces
Author :
Matoglu, Erdem ; Swaminathan, Madhavan ; Pham, Nam ; De Araujo, Daniel N. ; Cases, Moises
Author_Institution :
Georgia Inst. of Technol., Atlanta, GA, USA
Abstract :
The jitter and voltage margin of a source synchronous memory bus has been analyzed under various physical and operational conditions. Using sensitivity functions derived through linearly independent experiments, the statistical distribution of the performance has been computed. The sensitivity functions have also been utilized as a diagnosis tool to estimate the design parameters required to meet the performance specifications.
Keywords :
circuit analysis computing; distributed memory systems; jitter; sensitivity analysis; statistical analysis; system buses; design parameters estimation; diagnosis tool; high speed source synchronous interfaces; jitter; linearly independent experiments; operational conditions; performance specifications; physical conditions; sensitivity functions; source synchronous memory bus; statistical analysis; statistical diagnosis; statistical performance distribution; voltage margin; Analytical models; Connectors; Dielectric measurements; Distributed computing; Jitter; Parameter estimation; Statistical analysis; Statistical distributions; Switching circuits; Voltage;
Conference_Titel :
Electrical Performance of Electronic Packaging, 2002 IEEE 11th Topical Meeting on
Conference_Location :
Monterey, CA, USA
Print_ISBN :
0-7803-7451-7
DOI :
10.1109/EPEP.2002.1057919
