Behavioral modeling of IC ports including temperature effects

The development of temperature-dependent macromodels for digital IC ports is addressed. The proposed modeling approach is based on the theory of discrete-time parametric models and allows one to estimate the model parameters from voltage and current waveforms observed at the ports and to implement the model as a SPICE subcircuit. The proposed technique is validated by applying it to commercial devices described by detailed transistor-level models. The obtained models perform at a good accuracy level and are more efficient than the original transistor-level models.