DocumentCode :
2508508
Title :
Methodology on thermal prediction of high-power memory modules considering air velocity, chip size and power consumption
Author :
Park, Je-Hyoung ; Baik, Jae-Sang ; Chang, Jin-Kyu ; Seo, Seung-Jin
Author_Institution :
Samsung Electron., Hwasung, South Korea
fYear :
2012
fDate :
May 30 2012-June 1 2012
Firstpage :
1179
Lastpage :
1184
Abstract :
High-speed and high-density RDIMMs (Registered Dual Inline Memory Modules) which are employed in server platforms consume significant amount of power, operating at close to 100 °C. Thus it is very important to predict operating temperature of high-power memory modules at the early stage of development procedure to determine which type of cooling solution to employ. In this paper, we propose an approach for thermal prediction of high-power memory modules in server platforms. Through comprehensive thermal simulations using commercial CFD tool, FloTHERM, matrices of thermal data were obtained for various memory thermal conditions. Using the database, we built characteristic curves via curve-fitting. Characteristic curves are such that we can predict operating temperature of memory modules for various chip size and power dissipation under various memory thermal conditions. Predicted thermal results are in good agreement with measurement data with deviation of less than 3 °C (~5%).
Keywords :
computational fluid dynamics; cooling; curve fitting; integrated circuit packaging; modules; storage management chips; thermal analysis; CFD tool; FloTHER; air velocity; characteristic curves; chip size; cooling solution; curve-fitting; high-density RDIMM; high-power memory modules; memory thermal conditions; power consumption; registered dual inline memory modules; thermal data matrices; thermal prediction; thermal simulations; Atmospheric modeling; Data models; Memory management; Power dissipation; Random access memory; Servers; Temperature measurement; CFD tool; curve-fitting; memory module; server platform; temperature; thermal simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2012 13th IEEE Intersociety Conference on
Conference_Location :
San Diego, CA
ISSN :
1087-9870
Print_ISBN :
978-1-4244-9533-7
Electronic_ISBN :
1087-9870
Type :
conf
DOI :
10.1109/ITHERM.2012.6231556
Filename :
6231556
Link To Document :
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