DocumentCode :
2509591
Title :
Ferromagnetic Resonance Linewidth In Thin Films Coupled To NiO
Author :
McMichael, R.D. ; Chen, P.J. ; Egelhoff, W.F.
Author_Institution :
NIST
fYear :
1998
fDate :
6-9 Jan. 1998
Firstpage :
257
Lastpage :
257
Keywords :
Atomic layer deposition; Cobalt; Gold; Magnetic films; Magnetic properties; Magnetic resonance; Magnetization; Molecular beam epitaxial growth; Nuclear magnetic resonance; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MMM-Intermag Conference, 1998. Abstracts., The 7th Joint
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-5118-5
Type :
conf
DOI :
10.1109/INTMAG.1998.742337
Filename :
742337
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2509591
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