Title :
Enhanced Measurement Model for Subspace-Based Tracking
Author :
Yin, Shimin ; Yoo, Haan Joo ; Choi, Jin Young
Author_Institution :
EECS Dept., Seoul Nat. Univ., Seoul, South Korea
Abstract :
We present an efficient and robust measurement model for visual tracking. This approach builds on and extends work on measurement model of subspace representation. Subspace-based tracking algorithms have been introduced to visual tracking literature for a decade and show considerable tracking performance due to its robustness in matching. However, the measures used in their measurement models are not robust enough in cluttered backgrounds. We propose a novel measure of object matching referred to as WDIFS, which aims to improve the discriminability of matching within the subspace. Our measurement model can distinguish target from similar background clutters which often cause erroneous drift by conventional DFFS based measure. Experiments demonstrate the effectiveness of the proposed tracking algorithm under cluttered background.
Keywords :
image matching; image representation; learning (artificial intelligence); object detection; WDIFS measurement; background clutters; enhanced measurement model; matching discriminability; object matching; subspace representation; subspace-based tracking; visual tracking; weighted difference in feature space; Atmospheric measurements; Mathematical model; Particle measurements; Pollution measurement; Robustness; Target tracking; Visualization; Measurement Model; Subspace; Visual Tracking; Weighted Distance in Subspace;
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
Print_ISBN :
978-1-4244-7542-1
DOI :
10.1109/ICPR.2010.852