DocumentCode :
2510654
Title :
Proposed acceptance, qualification, and characterization tests for thin-film PV modules
Author :
Waddington, D. ; Mrig, L. ; DeBlasio, R. ; Ross, R.
Author_Institution :
Solar Energy Res. Inst., Golden, CO, USA
fYear :
1988
fDate :
1988
Firstpage :
1236
Abstract :
Details of a proposed test program for PV thin-film modules which the Department of Energy has directed SERI to prepare are presented. Results of one of the characterization tests that SERI has performed are also presented. The objective is to establish a common approach to testing modules that will be acceptable to both users and manufacturers. The tests include acceptance, qualification, and characterization tests. Acceptance tests verify that randomly selected modules have similar characteristics. Qualification tests are based on accelerated test methods designed to simulate adverse conditions. Characterization tests provide data on performance in a predefined environment.
Keywords :
semiconductor device testing; solar cells; standards; USA; acceptance; characterization; performance; qualification; semiconductor device testing; solar cells; test program; thin-film PV modules; Design methodology; Life estimation; Logic testing; Manufacturing; Materials testing; Performance evaluation; Production; Qualifications; Stability; Stress; System testing; Temperature; Testing; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Specialists Conference, 1988., Conference Record of the Twentieth IEEE
Conference_Location :
Las Vegas, NV, USA
Type :
conf
DOI :
10.1109/PVSC.1988.105902
Filename :
105902
Link To Document :
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