Title :
Hybrid OEIC Cost Sensitivity
Author_Institution :
University of Colorado
Keywords :
Computer aided manufacturing; Costs; Integrated circuit technology; Manufacturing processes; Optoelectronic devices; Pulp manufacturing; Semiconductor device manufacture; System testing; Virtual manufacturing; Yield estimation;
Conference_Titel :
Optical Microwave Interactions/Visible Semiconductor Lasers/Impact of Fiber Nonlinearities on Lightwave Systems/Hybrid Optoelectronic Integration and Packaging/Gigabit Networks., LEOS 1993 Summer Topi
Conference_Location :
Santa Barbara, CA, USA
Print_ISBN :
0-7803-1284-8
DOI :
10.1109/LEOSST.1993.696874
