DocumentCode :
2510887
Title :
Design and verification of 160 × 120 bolometer ROIC
Author :
Hu, Bin ; Li, Ping ; Ruan, Ai-wu ; Lin, Dao-ming
Author_Institution :
Key Lab. of Electron. Thin Films & Integrated Devices, Univ. of Electron. Sci. & Technol. of China, Chengdu, China
fYear :
2011
fDate :
21-23 Oct. 2011
Firstpage :
275
Lastpage :
278
Abstract :
A 160 × 120 bolometer uncooled infrared read out circuit (ROIC) and detector equivalent model were presented. The SPICE simulation model was based on the relationship between micro-bolometer material thermal parameters and electrical parameters. Blind pixel compensation technique was used in the ROIC to suppress self-heating effect. As the main part of the ROIC, capacitive transimpedance amplifier (CTIA) was used to integrate detector current, and selectable integration capacitors were used to extent dynamic range. Connecting with digital timing circuit, a 160×120 micro-bolometer ROIC was designed and manufactured by CSMC 0.5um DPTM CMOS process. The test results were the output swing of the chip was 2.6V and the typical power dissipation was 96mW, so the chip is very suitable for portable devices.
Keywords :
CMOS digital integrated circuits; SPICE; bolometers; capacitors; circuit simulation; infrared detectors; integrated circuit design; operational amplifiers; readout electronics; timing circuits; CSMC DPTM CMOS process; CTIA; SPICE simulation model; blind pixel compensation technique; bolometer ROIC design; bolometer ROIC verification; bolometer uncooled infrared readout circuit; capacitive transimpedance amplifier; capacitors; detector current; digital timing circuit; electrical parameters; infrared detector equivalent model; microbolometer material; portable device; self-heating effect suppression; size 0.5 mum; thermal parameters; Bolometers; Detectors; Equations; Immune system; Materials; Mathematical model; Resistance; Blind pixel; Bolometer; CTIA; ROIC;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computational Problem-Solving (ICCP), 2011 International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4577-0602-8
Electronic_ISBN :
978-1-4577-0601-1
Type :
conf
DOI :
10.1109/ICCPS.2011.6092228
Filename :
6092228
Link To Document :
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