• DocumentCode
    2511040
  • Title

    Noise reduction in nanometre CMOS

  • Author

    Coenen, Mart ; Van Roermund, Arthur

  • Author_Institution
    EMCMCC bv, Eindhoven, Netherlands
  • fYear
    2010
  • fDate
    12-16 April 2010
  • Firstpage
    1060
  • Lastpage
    1063
  • Abstract
    With nanometre scaling, the amount of transistors per 100 square millimetre will increase following Moore´s Law. The maximum power will, without additional cooling, be limited to a few watt whereas the on- and off-chip clock and data speeds will increase further. To accommodate this, the core supply voltages are reduced further down to below 1 volt as where the peripheral supply voltages will have to follow international agreed voltages levels to enable interfacing. While lowering the core supply voltages, the on-chip noise margin will drop accordingly and tight on- and off-chip decoupling measures are necessary. However by application, RF switching noise from nanometre CMOS designs are forced out of their packages through the supply and ground pins when applying conventional off-chip decoupling is applied. In this paper, the state-of-the-art, as well as a new noise reduction technique, which is possible with today´s nanometre CMOS processes, will be discussed together with guidance to accompanying complementary off-chip measures.
  • Keywords
    CMOS integrated circuits; integrated circuit design; integrated circuit noise; integrated circuit packaging; nanoelectronics; Moore law; RF switching noise; core supply voltages; nanometre CMOS design; noise reduction technique; off-chip decoupling; on-chip decoupling; on-chip noise margin; peripheral supply voltages; CMOS process; Clocks; Cooling; Moore´s Law; Noise measurement; Noise reduction; Packaging; Pins; Radio frequency; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4244-5621-5
  • Type

    conf

  • DOI
    10.1109/APEMC.2010.5475539
  • Filename
    5475539