DocumentCode
2511040
Title
Noise reduction in nanometre CMOS
Author
Coenen, Mart ; Van Roermund, Arthur
Author_Institution
EMCMCC bv, Eindhoven, Netherlands
fYear
2010
fDate
12-16 April 2010
Firstpage
1060
Lastpage
1063
Abstract
With nanometre scaling, the amount of transistors per 100 square millimetre will increase following Moore´s Law. The maximum power will, without additional cooling, be limited to a few watt whereas the on- and off-chip clock and data speeds will increase further. To accommodate this, the core supply voltages are reduced further down to below 1 volt as where the peripheral supply voltages will have to follow international agreed voltages levels to enable interfacing. While lowering the core supply voltages, the on-chip noise margin will drop accordingly and tight on- and off-chip decoupling measures are necessary. However by application, RF switching noise from nanometre CMOS designs are forced out of their packages through the supply and ground pins when applying conventional off-chip decoupling is applied. In this paper, the state-of-the-art, as well as a new noise reduction technique, which is possible with today´s nanometre CMOS processes, will be discussed together with guidance to accompanying complementary off-chip measures.
Keywords
CMOS integrated circuits; integrated circuit design; integrated circuit noise; integrated circuit packaging; nanoelectronics; Moore law; RF switching noise; core supply voltages; nanometre CMOS design; noise reduction technique; off-chip decoupling; on-chip decoupling; on-chip noise margin; peripheral supply voltages; CMOS process; Clocks; Cooling; Moore´s Law; Noise measurement; Noise reduction; Packaging; Pins; Radio frequency; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location
Beijing
Print_ISBN
978-1-4244-5621-5
Type
conf
DOI
10.1109/APEMC.2010.5475539
Filename
5475539
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