DocumentCode
2511289
Title
Characterization of quarter wavelength line as measurement standard for scattering parameter in the frequency range of W-band and D-band
Author
Horibe, Masahiro ; Kishikawa, Ryoko
Author_Institution
Nat. Inst. of Adv. Ind. Sci. & Technol., Tsukuba, Japan
fYear
2012
fDate
23-28 Sept. 2012
Firstpage
1
Lastpage
2
Abstract
This paper summarizes the technique to characterize quarter wavelength lines of rectangular waveguides as measurement standards for scattering parameters. The scattering parameters and their uncertainties were theoretically calculated using their dimensions. The SI traceability was established for the standard in the frequency range of W-band (from 75 GHz to 110 GHz) and D-band (from 110 GHz to 170 GHz).
Keywords
electromagnetic wave scattering; D-band frequency range; SI traceability; W-band frequency range; measurement standard; measurement standards; quarter wavelength line; rectangular waveguides; scattering parameter; Apertures; Frequency measurement; Length measurement; Scattering parameters; Standards; Transmission line measurements; Uncertainty;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared, Millimeter, and Terahertz Waves (IRMMW-THz), 2012 37th International Conference on
Conference_Location
Wollongong, NSW
ISSN
2162-2027
Print_ISBN
978-1-4673-1598-2
Electronic_ISBN
2162-2027
Type
conf
DOI
10.1109/IRMMW-THz.2012.6380303
Filename
6380303
Link To Document