DocumentCode :
2511806
Title :
Effective Dimensionality Reduction Based on Support Vector Machine
Author :
Moon, Sangwoo ; Qi, Hairong
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Univ. of Tennessee, Knoxville, TN, USA
fYear :
2010
fDate :
23-26 Aug. 2010
Firstpage :
173
Lastpage :
176
Abstract :
This paper presents an effective dimensionality reduction method based on support vector machine. By utilizing mapping vectors from support vector machine for dimensionality reduction purpose, we obtain features which are computationally efficient, providing high classification accuracy and robustness especially in noisy environment. These characteristics are acquired from the generalization capability of support vector machine by minimizing the structural risk. To further reduce dimensionality, this paper introduces the redundancy removal process based on an asymmetric decor relation measure with kernel function. Experimental results show that the proposed dimensionality reduction method provides the most appropriate trade off between classification accuracy and robustness in relatively low dimensional space.
Keywords :
feature extraction; image classification; support vector machines; asymmetric decor relation measure; dimensionality reduction method; dimensionality reduction purpose; kernel function; mapping vectors; removal process; support vector machine; Accuracy; Kernel; Noise measurement; Principal component analysis; Redundancy; Robustness; Support vector machines; Dimensionality reduction; asymmetric decorrelation; structural risk minimization; support vector machine;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition (ICPR), 2010 20th International Conference on
Conference_Location :
Istanbul
ISSN :
1051-4651
Print_ISBN :
978-1-4244-7542-1
Type :
conf
DOI :
10.1109/ICPR.2010.51
Filename :
5597626
Link To Document :
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