DocumentCode :
2511910
Title :
Automated GUI Testing for J2ME Software Based on FSM
Author :
Ying Hou ; Chen, Rang ; Du, Zhenjun
Author_Institution :
Sch. of Inf. Sci. & Technol., Dalian Maritime Univ., Dalian, China
fYear :
2009
fDate :
25-27 Sept. 2009
Firstpage :
341
Lastpage :
346
Abstract :
J2ME (Java 2 Micro Edition) software is playing a more and more significant role in embedded systems. However, with the growing complexity and function enhancement of J2ME software, its GUI (graphical user interface) testing is facing with great challenges. This paper proposes a new automated GUI testing method for J2ME software, which adopts an automated test case generation means based on FSM model and uses a unique program instrumentation scheme. Test cases are translated to the test script, which drives the J2ME program under test, and generates test report. In our experiments the automated testing system is implemented. Example Results show this testing method can automatically generate test cases for GUI based on the specification of the J2ME program and can also drive the running of the tests in the automated way. The testing method is more effective than the traditional ones; it has advantages, such as higher automation level, full fault-detection capability and general applicability. So, this method can see its applicable prospect in J2ME software testing.
Keywords :
Java; finite state machines; formal specification; graphical user interfaces; program testing; FSM model; J2ME program specification; J2ME software; Java 2 Micro Edition; automated GUI testing; automated test case generation; finite state machine; graphical user interface; unique program instrumentation scheme; Automatic testing; Automation; Communication system software; Embedded computing; Embedded software; Graphical user interfaces; Java; Materials testing; Software testing; System testing; FSM; GUI; J2ME; software testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Scalable Computing and Communications; Eighth International Conference on Embedded Computing, 2009. SCALCOM-EMBEDDEDCOM'09. International Conference on
Conference_Location :
Dalian
Print_ISBN :
978-0-7695-3825-9
Type :
conf
DOI :
10.1109/EmbeddedCom-ScalCom.2009.67
Filename :
5341641
Link To Document :
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