Title :
Dielectric relaxation study of binary mixtures having shielded charge distribution with exposed charge distribution using time domain reflectometry
Author :
Sayyad, S.B. ; Kolhe, S.B. ; Dubal, S.S. ; Undre, P.B. ; Shivalkar, K.N. ; Sonwane, P.T. ; Dharne, G.M. ; Patil, S.S. ; Khirade, P.W. ; Mehrotra, S.C.
Author_Institution :
Milliya Arts, Sci. & Manage. Sci. Coll., Beed
Abstract :
The importance of measuring the dielectric constant of a liquid lies in the fact that it provides valuable information about intermolecular interaction and dynamics of molecules at molecular levels. In Nitrobenzene (NB) and Chlorobenzene (CB) molecules the charge distribution is shielded and H-bonds do not appear where as in 2-Ethoxyethanol (2-EE) molecules the charge distribution is exposed. In pure nitrobenzene and chlorobenzene spatial correlation between molecules may appear only by means of dipole-dipole interactions. When there is an exposed distribution of charges, there may be very strong intermolecular interaction, however, in shielded distribution relative contribution to neighbor molecules is absent and hence there may be weak intermolecular interaction between the molecules of the liquids. Here the picoseconds time domain reflectometry in reflection mode has been used to obtain complex dielectric spectra epsiv* (omega) = epsiv\´ - jepsiv" of binary mixture of 2-EE with NB and CB in the frequency range of 10 MHz to 10 GHz at temperatures of 288, 298, 308 and 318 K.
Keywords :
dielectric relaxation; intermolecular mechanics; organic compounds; permittivity measurement; time-domain reflectometry; 2-ethoxyethanol; binary mixtures; charge distribution; chlorobenzene; dielectric constant measurement; dielectric relaxation; dielectric spectra; dipole-dipole interactions; frequency 10 MHz to 10 GHz; intermolecular interaction; molecule dynamics; nitrobenzene; temperature 288 K; temperature 298 K; temperature 308 K; temperature 318 K; time domain reflectometry; Dielectric constant; Ethanol; Frequency; Liquids; Microwave measurements; Neodymium; Niobium; Physics; Reflection; Reflectometry; Kirkwood correlation factor; Time domain reflectometry; dielectric constant;
Conference_Titel :
Recent Advances in Microwave Theory and Applications, 2008. MICROWAVE 2008. International Conference on
Conference_Location :
Jaipur
Print_ISBN :
978-1-4244-2690-4
Electronic_ISBN :
978-1-4244-2691-1
DOI :
10.1109/AMTA.2008.4763118