Title :
Measuring IC switching current waveforms using a GMI probe for power integrity studies
Author :
Zhou, Fan ; Wu, Songping ; Pommerenke, David ; Kayano, Yoshiki ; Inoue, Hiroshi ; Tan, Kenji ; Fan, Jun
Author_Institution :
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
Abstract :
IC switching current is the main noise source of many power integrity issues in printed circuit boards. Accurate measurement of the current waveforms is critical for an effective power distribution network design. In this paper, using a giant magnetoimpedance (GMI) probe for this purpose is studied. A side-band detection and demodulation system is built up to measure various time-domain waveforms using an oscilloscope. It is found that the GMI probes are potentially suitable for this kind of time-domain measurements, but probe designs and measurement setups need further improvements for this application.
Keywords :
circuit noise; circuit switching; giant magnetoresistance; oscilloscopes; power distribution; printed circuit design; probes; time-domain analysis; GMI probe; IC switching current waveform; demodulation system; giant magnetoimpedance probe; noise source; oscilloscope; power distribution network design; power integrity; printed circuit board; probe design; side-band detection; time-domain measurement; time-domain waveform measurement; Current measurement; Demodulation; Integrated circuit noise; Oscilloscopes; Power measurement; Power systems; Printed circuits; Probes; Switching circuits; Time domain analysis;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
DOI :
10.1109/APEMC.2010.5475607