DocumentCode :
2513296
Title :
Roles of ESD played in large computing system availability & reliability
Author :
Soohoo, Kwok M.
Author_Institution :
IBM Corp., Poughkeepsie, NY, USA
fYear :
2010
fDate :
12-16 April 2010
Firstpage :
463
Lastpage :
466
Abstract :
Product ESD testing per CISPR test requirements specifies direct and/or indirect ESD injection to the outside of the chassis of the product under test or to a vertical or horizontal coupling plane. In this paper additional ESD testing to insure customer satisfaction with large systems is discussed. Two additional ESD test methods are discussed with test locations internal to the normal external shield. First, the application of ESD during manufacturing process is intended to find product defects in order to increase field reliability. Second, internal system testing is intended to mimic potential problems from concurrent maintenance in order to insure system availability during system repair actions without impacting system availability for continuous customer usage.
Keywords :
customer satisfaction; electron device testing; electronic equipment testing; maintenance engineering; reliability; CISPR test requirement; ESD testing; concurrent maintenance; customer satisfaction; internal system testing; product defect screening; reliability; system availability; Availability; Circuit testing; Electromagnetic compatibility; Electrostatic discharge; History; Maintenance; Manufacturing; Probes; Relays; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
Type :
conf
DOI :
10.1109/APEMC.2010.5475656
Filename :
5475656
Link To Document :
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