Title :
An update to applications of open standards to test automation to board-level testing
Author :
Horth, Willis ; Nagy, James M. ; Debany, Warren H. ; Pritchett, Hugh ; Unkle, C.R. ; Swavely, William G. ; Newberg, Jeffery
Author_Institution :
Rome Lab., Griffiss AFB, NY, USA
Abstract :
An application of open standard formats to board-level test was described in a paper presented at AUTOTESTCON 1993. This paper provides an update to this work, including descriptions of the problems encountered and solutions developed in applying such standards to two specific printed circuit boards and two automatic test systems (ATSs): the GenRad 2751 and a Modular Automatic Test Equipment (MATE) compatible system. A complete test automation flow process developed around these open standards and data formats is described, including the specific software tools developed, and the input and output requirements of each tool
Keywords :
automatic test equipment; automatic test software; printed circuit testing; standards; GenRad 2751; MATE; Modular Automatic Test Equipment; TISSS; Test Description Language; board-level testing; open standards; printed circuit boards; test automation; test automation flow; tester independent software support system; Automatic test equipment; Automatic testing; Automation; Circuit testing; Printed circuits; Software standards; Software testing; Software tools; Standards development; System testing;
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
DOI :
10.1109/AUTEST.1994.381533
