Analysis of a test setup for the characterization of integrated circuits electromagnetic emissions

Author

Fiori, Franco ; Pignari, Sergio

Author_Institution

Dipt. di Elettronica, Politecnico di Torino, Italy

Volume

1

fYear

2000

fDate

2000

Firstpage

375

Abstract

This paper deals with the characterization of integrated circuits (ICs) electromagnetic emission. In particular, a critical assessment of IEC 61967-4 measurement procedure is presented. The correlation between the measurements and the emission properties of ICs is investigated. Signal degradation effects introduced by the test setup have been experimentally evaluated by exploiting an ad hoc calibration test board. Beyond a quantitative characterization of the limits of the above-mentioned measurement technique, the results shown in this paper allow the identification a new and effective way to describe electromagnetic emission of output drivers

Keywords

calibration; electromagnetic compatibility; electromagnetic interference; integrated circuit testing; measurement standards; printed circuits; test equipment; EMC; IEC 61967-4 measurement procedure; PCB; calibration test board; correlation; emission properties; integrated circuits electromagnetic emissions; measurements; output drivers; signal degradation effects; test setup; Circuit testing; Electromagnetic analysis; Electromagnetic compatibility; Electromagnetic measurements; IEC standards; Integrated circuit testing; Pins; Radio frequency; Radiofrequency integrated circuits; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2000. IEEE International Symposium on

Conference_Location

Washington, DC

Print_ISBN

0-7803-5677-2

Type

conf

DOI

10.1109/ISEMC.2000.875596

Filename

875596