Title :
Design of an integrated ATE amplifier
Author :
Bowhers, William J. ; McNeill, John A.
Author_Institution :
Boston Univ., MA, USA
Abstract :
A switch mode amplifier design is developed for application to automatic test equipment (ATE) instrumentation. This application requires simultaneous control and measurement of both voltage and current within a user specified region. Advantages and disadvantages of using a switch-mode topology are identified for the ATE application. Comparisons to a linear approach are presented. An integrated circuit to control crossover between voltage and current forcing is designed
Keywords :
CMOS analogue integrated circuits; automatic test equipment; electric current measurement; instrumentation amplifiers; network synthesis; switching circuits; voltage measurement; automatic test equipment; current measurement; integrated ATE amplifier; integrated circuit; simultaneous control and measurement; switch mode amplifier design; switch-mode topology; voltage measurement; Circuit topology; Costs; Current measurement; Driver circuits; Frequency; Instruments; Pulse amplifiers; Pulse width modulation; Switches; Voltage control;
Conference_Titel :
AUTOTESTCON '94. IEEE Systems Readiness Technology Conference. 'Cost Effective Support Into the Next Century', Conference Proceedings.
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-1910-9
DOI :
10.1109/AUTEST.1994.381542
