DocumentCode :
2514836
Title :
Electrostatic phenomena of ultrathin electrically insulating polyimide films: Space charge distribution and electronic density of states at the nanometric interface
Author :
Iwamoto, Mitsumasa ; Itoh, Eiji
Author_Institution :
Dept. of Phys. Electron., Tokyo Inst. of Technol., Japan
Volume :
1
fYear :
2000
fDate :
2000
Firstpage :
55
Abstract :
Nanometric electrostatic phenomena in ultrathin insulator films at the metal-film interface are described. The space charge distribution in Langmuir-Blodgett (LB) films on metal electrodes is determined on the order of nanometer film thickness scale from the surface potential method, and the distribution of electron density of states, electron acceptor and donor states, is calculated from the temperature dependence of the space charge distribution, assuming that electronic charges are displaced from metals to LB films until a thermodynamic equilibrium is established at the metal-film interface. Using three kinds of polyimide (PI) LB films deposited on various kinds of metal electrodes, surface potential of these films have been examined as a function of the number of deposited layers at a temperature between -100°C and +150°C. Then the space charge distribution and electronic density of states in these films were determined, and the presence of electron acceptor-states was revealed
Keywords :
Langmuir-Blodgett films; electronic density of states; insulating thin films; metal-insulator boundaries; polymer films; space charge; surface potential; -100 to 150 C; Langmuir-Blodgett film; acceptor states; donor states; electronic density of states; electrostatic phenomena; metal electrode; nanometric interface; polyimide film; space charge distribution; surface potential; temperature dependence; ultrathin insulating film; Chemicals; Dielectric losses; Dielectrics and electrical insulation; Electrical engineering; Electrodes; Electrons; Electrostatics; Metal-insulator structures; Polyimides; Space charge;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Properties and Applications of Dielectric Materials, 2000. Proceedings of the 6th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
0-7803-5459-1
Type :
conf
DOI :
10.1109/ICPADM.2000.875628
Filename :
875628
Link To Document :
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