Title :
Passive-intermodulation analysis between rough circular waveguide flanges using Weibull distribution
Author :
Wang, X.B. ; Zhang, N. ; Hu, T.C. ; Sun, Q.F. ; Cui, W.Z. ; Ye, M. ; He, Y.N.
Author_Institution :
Nat. Key Lab. of Sci. & Technol. on Space Microwave Technol., Inst. of Space Radio Technol., Xi´´an, China
Abstract :
In this paper, the Weibull distribution is employed to characterise the surface topography in the analysis of the passive intermodulation (PIM) between rough circular waveguide flanges, where the PIM level as a function of different system parameters such as the applied pressure, roughness, layer thickness and the power ratio has been developed assuming that the PIM level for a particular set of parameters is known. The proposed method is more significant when the contact surface needs to be described by parameters like the skewness or the kurtosis.
Keywords :
Weibull distribution; circular waveguides; intermodulation; Weibull distribution; contact surface; passive-intermodulation analysis; rough circular waveguide flanges; surface topography; Electromagnetic waveguides; Flanges; Microwave technology; Rectangular waveguides; Rough surfaces; Space technology; Surface roughness; Surface topography; Surface waves; Weibull distribution; Gaussian distribution; Passive intermodulation; Taylor expansion; Weibull distribution; circular waveguide; nonlinearities;
Conference_Titel :
Electromagnetic Compatibility (APEMC), 2010 Asia-Pacific Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-5621-5
DOI :
10.1109/APEMC.2010.5475733
