Title :
Calibration of Equivalent Finite Element Model for Packaged Printed Circuit Board by Experimental Modal Analysis
Author :
Lee, Ying-Chih ; Wang, Bor-Tsuen ; Lail, Yi-Shao ; Yeh, Chang-Lin ; Chen, Rong-Sheng
Author_Institution :
Dept. of Eng. Sci., Nat. Cheng Kung Univ., Tainan, Taiwan
Abstract :
In this work, the experimental modal analysis (EMA) was performed to establish an equivalent finite element (FE) model for a standard JEDEC drop test printed circuit board (PCB) mounted with packages in a full array. Material properties of the equivalent FE model of the packaged PCB were calibrated through an optimization process with respect to natural frequencies based on EMA results obtained with a free boundary condition. The model was then applied to determine screwing tightness of the packaged PCB corresponding to a fixed boundary condition with the four corners of the PCB constrained, as defined by JEDEC for a board-level drop test.
Keywords :
calibration; finite element analysis; modal analysis; optimisation; printed circuit testing; printed circuits; JEDEC; board-level drop test; calibration; equivalent finite element was model; experimental modal analysis; free boundary condition; natural frequencies; optimization; packaged PCB; packaged printed circuit board; screwing tightness; Boundary conditions; Calibration; Circuit testing; Finite element methods; Frequency; Material properties; Modal analysis; Packaging; Performance evaluation; Printed circuits;
Conference_Titel :
Electronics Packaging Technology Conference, 2008. EPTC 2008. 10th
Conference_Location :
Singapore
Print_ISBN :
978-1-4244-2117-6
Electronic_ISBN :
978-1-4244-2118-3
DOI :
10.1109/EPTC.2008.4763471