Title :
Introduction and overview of artificial neural networks in instrumentation and measurement applications
Author :
Hudson, William B.
Author_Institution :
Dept. of Electr. & Comput. Eng., Kansas State Univ., Manhattan, KS, USA
Abstract :
The author describes some neural network implementations as well as provides readers with basic artificial neural network theory and references to allow them to explore the applicability of neural network technologies for their specific applications. Ideas presented allow inclusion of neural network computational strategies in instrumentation and measurement applications. The terminology and training methods are outlined
Keywords :
computerised instrumentation; learning (artificial intelligence); neural nets; artificial neural networks; computational strategies; instrumentation; measurement applications; theory; training; Analog computers; Application software; Artificial neural networks; Computer networks; Dielectric measurements; Electric variables measurement; Instrumentation and measurement; Intelligent networks; Spirals; Turing machines;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1993. IMTC/93. Conference Record., IEEE
Conference_Location :
Irvine, CA
Print_ISBN :
0-7803-1229-5
DOI :
10.1109/IMTC.1993.382568
