Title :
On the speedup of single-disk failure recovery in XOR-coded storage systems: Theory and practice
Author :
Zhu, Yunfeng ; Lee, Patrick P C ; Hu, Yuchong ; Xiang, Liping ; Xu, Yinlong
Author_Institution :
Univ. of Sci. & Technol. of China, Hefei, China
Abstract :
Modern storage systems stripe redundant data across multiple disks to provide availability guarantees against disk failures. One form of data redundancy is based on XOR-based erasure codes, which use only XOR operations for encoding and decoding. In addition to providing failure tolerance, a storage system must also provide fast failure recovery to avoid data unavailability. We consider the problem of speeding up the recovery of a single-disk failure for arbitrary XOR-based erasure codes. We address this problem from both theoretical and practical perspectives. We propose a replace recovery algorithm, which uses a hill-climbing technique to search for a fast recovery solution, such that the solution search can be completed within a short time period. We further implement our replace recovery algorithm atop a parallelized architecture to justify its practicality. We experiment our replace recovery algorithm and its parallelized implementation on a networked storage system testbed, and demonstrate that our replace recovery algorithm uses less recovery time than the conventional approach.
Keywords :
decoding; disc storage; error correction codes; parallel architectures; redundancy; system recovery; XOR-based erasure codes; XOR-coded storage systems; data redundancy; data unavailability; decoding; encoding; failure tolerance; hill-climbing technique; networked storage system testbed; parallelized architecture; recovery solution search; recovery time; replace recovery algorithm; single-disk failure recovery; Complexity theory; Computational modeling; Encoding; Equations; Generators; Mathematical model; Strips;
Conference_Titel :
Mass Storage Systems and Technologies (MSST), 2012 IEEE 28th Symposium on
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4673-1745-0
Electronic_ISBN :
2160-195X
DOI :
10.1109/MSST.2012.6232371