Title :
A magnetically shielded instrument for magnetoresistance and noise characterizations of magnetic tunnel junction sensors
Author :
Lei, Z.Q. ; Li, G.J. ; Lai, P.T. ; Pong, Philip W T ; Egelhoff, William F., Jr.
Author_Institution :
Dept. of Electr. & Electron. Eng., Univ. of Hong Kong, Hong Kong, China
Abstract :
A magnetically shielded setup was developed for characterizing magnetoresistance (MR) and noise properties of magnetic tunneling junction (MTJ) sensors. A mu-metal shielding is installed to avoid the interference of external magnetic disturbance. Both MR curves and noise power spectra of MTJ sensors can be obtained for further data analysis. Moreover, a hard-axis magnetic field can be applied to eliminate the hysteresis and the linear field response of MTJ sensors can be measured. The preliminary measurement results on MTJ sensors are presented to illustrate the characterization capabilities of this setup.
Keywords :
1/f noise; data analysis; magnetic sensors; tunnelling magnetoresistance; MR curves; MTJ sensors; data analysis; hard-axis magnetic field; linear field response; magnetic disturbance; magnetic tunneling junction sensors; magnetically shielded instrument; magnetoresistance; mu-metal shielding; noise characterization; noise power spectra; noise property; Annealing; Magnetic noise; Magnetic shielding; Magnetic tunneling; Navigation; Noise measurement; Tunneling magnetoresistance; 1/f noise; mangetic tunnel junction (MTJ); measurement setup; tunneling magnetoresistance (TMR);
Conference_Titel :
Electron Devices and Solid-State Circuits (EDSSC), 2010 IEEE International Conference of
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-9997-7
DOI :
10.1109/EDSSC.2010.5713688
