Title :
High temperature aging of enameled copper wire — Relationships between chemical structure and electrical behavior
Author :
Petitgas, B. ; Seytre, G. ; Gain, O. ; Boiteux, G. ; Royaud, I. ; Serghei, A. ; Gimenez, A. ; Anton, A.
Author_Institution :
Ing. des Mater. Polymeres, Univ. de Lyon, Villeurbanne, France
Abstract :
This work presents the physico-chemical behavior of several enameled copper wires systems such as PolyEsterImide (PEI)/PolyAmideImide (PAI) or PAI based multi layers compared to PolyImide (PI) which remains the basic enamel material for high temperature applications. The structural, thermal and electrical properties of these systems have been investigated before and after aging in the 200°C-400°C temperature range by thermogravimetric analysis (TGA), ATR-FTIR microscopy, thermomechanical analysis (TMA) and dielectric relaxation spectroscopy (DRS). It has been particularly interesting to carry out physico-chemical analysis directly on enameled wires to improve the understanding of their thermal and electrical behaviour. Dielectric spectroscopy has indicated a loss of insulating properties during the thermal cycle especially for PEI-containing enamels whereas the properties of PI and PAI have been maintained. TGA and IR analyses have not only allowed confirming the PI and PAI high thermal performances, but have also given information on the thermal and chemical stability of PEI/PAI. Such investigations could be helpful for improving the enameled wire high temperature performances.
Keywords :
ageing; attenuated total reflection; copper; enamels; insulating materials; thermal analysis; thermal stability; wires (electric); ATR-FTIR microscopy; Cu; DRS; IR analyses; PAI based multilayers; PEI; TGA analysis; TMA; chemical stability; chemical structure; dielectric relaxation spectroscopy; electrical behavior; electrical properties; enamel material; enameled copper wires systems; enameled wire high temperature performances; high temperature aging; insulating property loss; physico-chemical behavior analysis; polyamideimide; polyesterimide; structural properties; temperature 200 degC to 400 degC; thermal cycle; thermal properties; thermal stability; thermogravimetric analysis; thermomechanical analysis; Aging; Chemicals; Copper; Degradation; Dielectrics; Materials; Wires; ATR-FTIR; DMA; PAI; PEI; PI; TGA; TMA; chemical stability; dielectric spectroscopy; enameled wire; postcuring; thermal aging;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena (CEIDP), 2011 Annual Report Conference on
Conference_Location :
Cancun
Print_ISBN :
978-1-4577-0985-2
DOI :
10.1109/CEIDP.2011.6232602